The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Oct. 13, 2022
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Abdulmohsen Alali, Dammam, SA;

Yazeed Altowairqi, Dhahran, SA;

Constantinos Tsingas, Dhahran, SA;

Ali M. Jadhar, Saihat, SA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/34 (2006.01); E21B 44/00 (2006.01); E21B 49/00 (2006.01); G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/345 (2013.01); E21B 44/00 (2013.01); E21B 49/00 (2013.01); G01V 1/282 (2013.01); G01V 1/301 (2013.01); G01V 2210/64 (2013.01); G01V 2210/65 (2013.01); G01V 2210/74 (2013.01);
Abstract

A method may include determining various migrated azimuthal dip-angle gathers based on a migration function and seismic data from a seismic survey regarding a geological region of interest. The method may further include determining various partial dip-angle images using the migrated azimuthal dip-angle gathers. The method may further include determining various azimuthal bins that include the partial dip-angle images. The method may further include determining various wavefield components using an independent component analysis (ICA) function and the partial dip-angle images among the azimuthal bins. The method may further include determining a geological feature within the geological region of interest using the wavefield components.


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