The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Mar. 31, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Akira Tsuji, Tokyo, JP;

Yoshimasa Ono, Tokyo, JP;

Junichi Abe, Tokyo, JP;

Jiro Abe, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01S 7/48 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4808 (2013.01);
Abstract

A detection device () according to the present disclosure includes an acquisition unit () that acquires point cloud data indicating a distance from a measurement device to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit () that performs edge detection based on the luminance information, and a crack determination unit () that determines whether an area indicates a crack by using a shape of the area in which, of a plurality of points indicated by the point cloud data, points having luminance within a predetermined range of difference from luminance of a point detected as an edge are distributed.


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