The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Feb. 07, 2023
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Neal Eldrich Solmeyer, Edina, MN (US);

Matthew Wade Puckett, Phoenix, AZ (US);

Matthew Robbins, Minneapolis, MN (US);

Jianfeng Wu, Tucson, AZ (US);

Mary Salit, Plymouth, MN (US);

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/345 (2006.01); G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01R 33/345 (2013.01); G01R 33/26 (2013.01);
Abstract

Systems for an integrated photonic responsive material sensor are described herein. In certain embodiments, a system includes a carrier wafer that includes a cavity formed in the carrier wafer. The carrier wafer also includes a responsive waveguide coupled to the cavity, the responsive waveguide formed from responsive material responsive to a force by shifting a resonance frequency of point defects in the responsive material in response to the force, wherein a pump light is directed to the responsive waveguide to prepare the responsive waveguide to absorb a probe light when exposed to a radio frequency at the point defect resonance frequency. Additionally, the system includes components coupled to the carrier wafer, wherein the components include a probe light source that generates the probe light, wherein the components are positioned in relation to the carrier wafer to couple the probe light into the cavity.


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