The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Apr. 14, 2021
Shimadzu Corporation, Kyoto, JP;
Satoru Watanabe, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An analysis assistance device includes an estimator that estimates distribution of measurement quality index data using a plurality of analysis condition data to be provided to an analysis device and a plurality of measurement data obtained in the analysis device based on the plurality of analysis condition data, and a measurement quality index outputter that outputs for display a region where the measurement quality index data is not less than a predetermined threshold value as a design space, and the measurement quality index outputter outputs the region of the design space in an enlarged manner by cutting off at least part of a region other than the design space in a distribution region of the measurement quality index data.