The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Dec. 16, 2020
Applicant:
Posco, Pohang-si, KR;
Inventors:
Assignee:
POSCO, Pohang-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/28 (2006.01); G01N 29/04 (2006.01); G01N 29/34 (2006.01); G01N 33/2045 (2019.01);
U.S. Cl.
CPC ...
G01N 29/28 (2013.01); G01N 29/04 (2013.01); G01N 29/348 (2013.01); G01N 33/2045 (2019.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01);
Abstract
The present invention relates to an ultrasonic testing apparatus with a variable frequency, which can automatically change the frequency according to thickness and thereby detect internal defects in objects having various thicknesses. The ultrasonic testing apparatus may comprise: a nozzle jetting a medium toward an object so as to form a medium column; and a plurality of probes disposed in the nozzle so as to generate ultrasonic waves.
Lim, Choong-Soo. (2025). Ultrasonic testing apparatus with variable frequency (U.S. Patent No. 12339254). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12339254
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile