The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Jan. 12, 2022
Hitachi, Ltd., Tokyo, JP;
Tomonari Misawa, Tokyo, JP;
Takuya Kambayashi, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
To provide a particle measuring device capable of removing particles adhering to an observation window for capturing an image of the particles and measuring an accurate particle size distribution. A particle measuring device that image-recognizes particles contained in a fluid to be measured and measures a physical quantity of the particles includes: a sample holding region that holds a sample containing the particles; an observation window disposed on a wall surface of the sample holding region; and a cleaning nozzle configured to discharge a cleaning liquid toward the observation window, in which the cleaning liquid is different from the fluid to be measured.