The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Jun. 07, 2024
Radiant Vision Systems, Llc, Redmond, WA (US);
Eric Christopher Eisenberg, Bothell, WA (US);
Javier Antonio Ruiz, Oceanside, CA (US);
Erin Marie Elizabeth Brown, Redmond, WA (US);
RADIANT VISION SYSTEMS, LLC, Redmond, WA (US);
Abstract
Methods for compensating measurements of devices under test (DUTs) captured through prescription lenses (and associated imaging systems, devices, and methods) are described herein. In one embodiment, a method for characterizing focus quality of a DUT through a prescription lens includes adjusting an optical power of a measurement device to compensate for optical power provided by the prescription lens. The method further comprises imaging, using the measurement device, a test pattern through the prescription lens, wherein the test pattern is displayed by the DUT; measuring contrast of an edge in the test pattern at a point of interest within the imaging of the test pattern; and determining focus quality of the DUT based at least in part on the contrast measurement.