The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Dec. 18, 2023
Chain measurement device, chain measurement system, and method for calculating slack amount of chain
Applicant:
Daido Kogyo Co., Ltd., Ishikawa, JP;
Inventors:
Daigo Masumoto, Ishikawa, JP;
Tadashi Sekido, Ishikawa, JP;
Yoshiaki Sawade, Ishikawa, JP;
Naoto Himiyama, Ishikawa, JP;
Sora Demura, Ishikawa, JP;
Assignee:
DAIDO KOGYO CO., LTD., Ishikawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/101 (2020.01); F16H 7/00 (2006.01); F16H 7/06 (2006.01);
U.S. Cl.
CPC ...
G01L 5/101 (2013.01); F16H 7/00 (2013.01); F16H 7/06 (2013.01);
Abstract
A chain measurement device is for measuring a slack amount of a chain wound around sprockets. The chain measurement device includes a main body portion including an acceleration sensor, and an attachment portion configured to attach the main body portion to the chain. The acceleration sensor is configured to detect acceleration in a gravitational direction in a case where the main body portion attached to the chain is lifted upward within a range of the slack amount of the chain and then dropped.