The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Dec. 13, 2017
Applicant:

Nokia of America Corporation, Murray Hill, NJ (US);

Inventor:

Michael Eggleston, New York, NY (US);

Assignee:

Nokia of America Corporation, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G01B 9/02001 (2022.01); G01B 9/02004 (2022.01); G01B 9/02091 (2022.01); G01N 21/47 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); G01B 9/02004 (2013.01); G01B 9/02007 (2013.01); G01B 9/02091 (2013.01); G01N 21/65 (2013.01); G01N 21/4795 (2013.01); G01N 2021/655 (2013.01);
Abstract

An apparatus includes first and second light sources, an optical interferometer, one or more light detectors, and an electronic processor. The second light source is configured to output light of a different wavelength than the first source. The optical interferometer has optical reference and sample arms. The optical sample arm has a first optical path to transmit light received from the first and second light sources to an area of a target and has a second optical path to transmit light collected from the area of the target to one or more interference regions. The optical reference arm is configured to transmit light received from the first light source to the one or more interference regions. Each light detector is configured to produce electrical signals indicative of measured intensities of interfered light in a corresponding one of the one or more interference regions. The electronic processor is configured to determine, from the electrical signals, information indicative of a depth dependence of stimulated Raman optical emission in the area of the target.


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