The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Jun. 17, 2022
Applicant:

Eotech, Llc, Plymouth, MI (US);

Inventor:

Dean Loebig, Howell, MI (US);

Assignee:

EOTech, LLC, Plymouth, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F41G 1/17 (2006.01); F41G 1/30 (2006.01); F41G 1/38 (2006.01);
U.S. Cl.
CPC ...
F41G 1/17 (2013.01); F41G 1/30 (2013.01); F41G 1/38 (2013.01);
Abstract

A weapon system has an optical sight mounted to a weapon and a frame with a sight window that is configured to superimpose a reticle that is visible through the sight window in a first focal plane. An optoelectronic device is mounted to the weapon and includes an imager with a sensor array and a display device. An image processor is configured to receive image data captured by the sensor array and process the image data to generate a subset image that is received from a select region of the sensor array. The select region of the sensor array defines a second focal plane. A controller is configured to receive an input from an operator, and in response to the input, to select the select region of the sensor array for aligning the second focal plane with the first focal plane.


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