The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Apr. 18, 2019
Applicants:
Massachusetts Institute of Technology, Cambridge, MA (US);
The Broad Institute, Inc., Cambridge, MA (US);
Inventors:
Sarah DiIorio, Cambridge, MA (US);
Joshua Elacqua, Cambridge, MA (US);
Arnaud Gutierrez, Cambridge, MA (US);
Navpreet Ranu, Cambridge, MA (US);
Paul Blainey, Cambridge, MA (US);
Assignees:
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, Cambridge, MA (US);
THE BROAD INSTITUTE, INC., Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6806 (2018.01); C12Q 1/6827 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6876 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6806 (2013.01); C12Q 1/6827 (2013.01); C12Q 1/6876 (2013.01); C12N 2310/20 (2017.05); C12Q 1/6844 (2013.01); C12Q 2600/106 (2013.01); C12Q 2600/156 (2013.01);
Abstract
The present disclosure relates to compositions and methods for detection of single-stranded breaks (SSBs) in dsDNA, including in genomic DNA. Measurement of the precise location of SSB damage in DNA, e.g., genomic DNA, is provided, and involves an approach that is compatible with next-generation sequencing.