The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Mar. 20, 2020
Prima Industrie S.p.a., Collegno, IT;
Michele De Chirico, Collegno, IT;
PRIMA INDUSTRIE S.P.A., Collegno, IT;
Abstract
A method for additive manufacturing, wherein an additive-manufacturing head () is provided, configured both for directing one or more jets of powders, in particular metal powders, onto a region of a working surface (), and for directing simultaneously a laser beam onto such a region, to form a laser-beam focusing spot (LS) on the region, and wherein, during direction of the powder jets and of the laser beam, the additive-manufacturing head () is simultaneously translated in a direction transverse to the direction of the laser beam so as to give rise to a trace (MRP) obtained by melting of the powders as a result of the power transmitted to the powders by the focusing spot (LS). During movement of the additive-manufacturing head () in the transverse direction, a dynamic movement is imparted on the laser beam emitted by the head (), the movement being configured in such a way as to obtain a width of the trace (MRP) that is independent of the size of the focusing spot (LS) of the laser beam (L) and is equivalent to the one that would be produced by an apparent spot having a width substantially corresponding to the width of the trace (MPP), and in such a way that the distribution of the power transmitted by the laser beam to the trace (MPP) varies along the direction of the width of the trace (MPP).