The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Oct. 21, 2022
Applicant:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Inventors:
Ke Li, Madison, WI (US);
Guang-Hong Chen, Madison, WI (US);
Assignee:
WISCONSIN ALUMNI RESEARCH FOUNDATION, Madison, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/42 (2024.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01); A61B 6/4241 (2013.01); G01T 1/20 (2013.01);
Abstract
A system and method for a hybrid detector for a computed tomography (CT) system are provided that include a semiconductor detector arranged to generate photon-counting CT data upon receiving x-rays and a scintillator detector arranged proximate to the semiconductor detector to receive scattered x-rays and generate energy-integrating CT data upon receiving the scattered x-rays.
Quick Actions:
Li, Ke. (2025). Systems and methods for improved computed tomography using photon-counting detectors (U.S. Patent No. 12336849). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12336849
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile