The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Nov. 15, 2023
Steris Instrument Management Services, Inc., Birmingham, AL (US);
Maciej Dybiec, Cooper City, FL (US);
STERIS Instrument Management Services, Inc., Birmingham, AL (US);
Abstract
An objective of an endoscope can be evaluated by collecting a series of differently focused images and digitally stitching them together to obtain a final image for the endoscope that can be then evaluated. Movable optics and/or a camera can be used to collect the series of differently focused images. Image processing algorithms can be used to evaluate the collected images in terms of image sharpness and identify the areas at which each image is in relatively good focus. Once the areas of good focus are identified, the image processing algorithms can extract the areas of good focus. The digital stitching algorithms can be used to assemble the extracted areas of good focus to form a final image where most of the target scene should be in focus. The final image is then reviewed to determine the acceptability of the objective.