The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Sep. 14, 2021
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yosuke Naruse, Kyoto, JP;

Koichi Taguchi, Kyoto, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/72 (2023.01); G01N 21/88 (2006.01); H04N 23/73 (2023.01); H04N 23/74 (2023.01);
U.S. Cl.
CPC ...
H04N 23/72 (2023.01); G01N 21/8806 (2013.01); H04N 23/73 (2023.01); H04N 23/74 (2023.01); G01N 2021/8835 (2013.01);
Abstract

An imaging condition setting system sufficiently reduces the effects of ambient light in designing optimized illumination patterns for imaging an inspection target. The system includes an imager that captures an image of a workpiece being the inspection target, an illuminator including a light source that illuminates the workpiece with light, and an imaging condition setter that sets an imaging condition to capture an image of the workpiece. The imaging condition setter sets, for the image captured with light from the illuminator to the workpiece at a luminosity greater than or equal to a threshold, an exposure time of the imager to cause a value of a pixel in a specific area of the image of the workpiece to be within a specific range.


Find Patent Forward Citations

Naruse, Yosuke. (2025). Imaging condition setting system, imaging condition setting method, and program (U.S. Patent No. 12335628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12335628

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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