The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Apr. 15, 2024
Applicant:

Pano Ai, Inc., San Francisco, CA (US);

Inventors:

Sonia Kastner, San Francisco, CA (US);

Seva Safris, Las Vegas, NV (US);

Kira Greco, San Francisco, CA (US);

Sean Donohue, Bellingham, WA (US);

Ryan McKenzie White, Menlo Park, CA (US);

Assignee:

Pano AI, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/667 (2023.01); H04N 23/61 (2023.01); H04N 23/62 (2023.01); H04N 23/66 (2023.01); H04N 23/69 (2023.01);
U.S. Cl.
CPC ...
H04N 23/667 (2023.01); H04N 23/61 (2023.01); H04N 23/62 (2023.01); H04N 23/66 (2023.01); H04N 23/69 (2023.01);
Abstract

The technical solutions described herein are systems and methods for multi-mode image capture device operation. The system can obtain, from a first image capture device in accordance with a first mode, a first set of images corresponding to a first range of angles about an axis. The system can obtain, from a second image capture device in accordance with the first mode, a second set of images corresponding to a second range of angles about the axis. The system can cause, responsive to an interruption of the first mode, the second image capture device to obtain a third set of images corresponding to the first range of angles about the axis in accordance with a second mode.


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