The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Mar. 30, 2022
Applicant:

Denso Corporation, Kariya, JP;

Inventor:

Syuhei Miyachi, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/495 (2006.01); H01L 23/00 (2006.01); H01L 23/29 (2006.01); H01L 25/07 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49541 (2013.01); H01L 23/293 (2013.01); H01L 24/32 (2013.01); H01L 24/40 (2013.01); H01L 25/074 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/40245 (2013.01); H01L 2924/13055 (2013.01); H01L 2924/13091 (2013.01);
Abstract

A semiconductor module includes: two semiconductor elements stacked in a vertical direction to overlap at least a part of the semiconductor elements; a conductive member stacked on the semiconductor elements and electrically connected to at least one of the semiconductor elements; and a resin mold integrally sealing the semiconductor elements and the conductive member. A lower semiconductor element has at least observable positions of both ends of two sides substantially orthogonal to each other when viewed from above in the vertical direction without arranging the resin mold.


Find Patent Forward Citations

Miyachi, Syuhei. (2025). Semiconductor module with improved inspectability of stacked semiconductor elements (U.S. Patent No. 12334418). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12334418

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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