The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
May. 09, 2023
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Taewook Park, Suwon-si, KR;
Eunhye Oh, Suwon-si, KR;
Jisu Kang, Suwon-si, KR;
Yongki Lee, Suwon-si, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/36 (2006.01); G01R 31/317 (2006.01); G01R 31/3193 (2006.01); G06F 11/10 (2006.01); G11C 29/00 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/36 (2013.01); G01R 31/31703 (2013.01); G01R 31/3193 (2013.01); G06F 11/1048 (2013.01); G11C 29/022 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/4401 (2013.01); G11C 29/52 (2013.01); G11C 29/56008 (2013.01); G11C 29/76 (2013.01); G11C 29/78 (2013.01); G11C 29/808 (2013.01); G11C 2029/1204 (2013.01); G11C 2029/3602 (2013.01);
Abstract
An operation method of a memory device includes programming a test pattern in a normal area, obtaining locations of error bits with respect to the test pattern and an error count for each error bit location, and repairing faulty cells included in the normal area with redundancy cells in a redundancy area based on the locations of the error bits and the error counts.