The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 31, 2023
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Il Ho Lee, Yongin-si, KR;

Taejoon Kim, Yongin-si, KR;

Jinwoo Park, Yongin-si, KR;

Yerin Oh, Yongin-si, KR;

Seungrok Lee, Yongin-si, KR;

Wankee Jun, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); G09G 3/3208 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G06F 3/0412 (2013.01); G06F 3/04166 (2019.05); G06F 3/0418 (2013.01); G06F 3/0446 (2019.05); G09G 3/3208 (2013.01); G09G 2354/00 (2013.01);
Abstract

An inspection system includes a display device product comprising a display panel and an input sensor; and an inspection device comprising an inspection signal generator configured to provide to the display panel an inspection signal indicative of a first image pattern, a memory configured to store a reference signal responsive to a second image pattern, and a noise detector configured to receive from the input sensor a sensing signal responsive to the first image pattern, detect a first noise based on the sensing signal, and detect a second noise based on the reference signal.


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