The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 15, 2023
Applicant:

Online Development, Incorporated, Knoxville, TN (US);

Inventors:

Keith A. Walton, Jonesborough, TN (US);

Kai T. Bouse, Loudon, TN (US);

Assignee:

Online Development, Incorporated, Knoxville, TN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/14 (2006.01); G07C 3/12 (2006.01);
U.S. Cl.
CPC ...
G07C 3/12 (2013.01); G06F 17/142 (2013.01);
Abstract

A system and method for detecting abnormal operating conditions in a machine through the analysis and comparison of radar areas after the transformation of waveform data collected from machine parts. An example embodiment is configured to: generate a monitoring signal in response to the behavior of a machine while the machine is in operation; simultaneously monitor two or more spectrums in the monitoring signal; collect data for two ore more spectrums at times when the machine is operating normally to establish an operational baseline of said machine; identify a respective energy level in each of the two or more spectrums; process waveform data corresponding to each of said identified energy levels into a Fast Fourier Transform radar plot; determine an area that corresponds to the FFT radar plot; correlate changes in the area of the FFT radar plot with changes in spectrum data and changes in the operation of the machine.


Find Patent Forward Citations

Walton, Keith. (2025). Machine function analysis with radar plot (U.S. Patent No. 12333864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12333864

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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