The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Apr. 07, 2022
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Kashif Rashid, Wayland, MA (US);

Andrew J. Speck, Milton, MA (US);

Andrew Emil Pomerantz, Lexington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/17 (2022.01); G06V 20/10 (2022.01); G08G 5/32 (2025.01);
U.S. Cl.
CPC ...
G06V 20/176 (2022.01); G06V 20/17 (2022.01); G08G 5/32 (2025.01);
Abstract

Methods and apparatus for fugitive emission detection. In some embodiments, the method can include planning and performing aerial inspections of a plurality of structures within one or more facilities by determining a flight path for a scanning of fugitive emissions from a plurality of structures within one or more facilities. The flight path can cover a set of structure clusters that can be serviced by a base. The method can also include using a computer-implemented clustering method to identify the set of structure clusters that can be serviced by the respective base. The clustering method can be a hierarchical multilevel clustering method. The method can also include scanning the plurality of structures for fugitive emissions using an airborne sensor. The airborne sensor can be mounted to a flight vehicle launched from the base. The method can also include classifying the plurality of structures based on results of the scanning.


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