The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Mar. 07, 2022
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Parama Pal, Bangalore, IN;

Earu Banoth, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/174 (2017.01); G06T 3/4007 (2024.01);
U.S. Cl.
CPC ...
G06T 7/174 (2017.01); G06T 3/4007 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10056 (2013.01);
Abstract

This disclosure relates generally to speckle image analysis, and, more particularly, to a system and method for imaging of localized and heterogenous dynamics using laser speckle. Existing speckle analysis techniques do not offer the capability to achieve both the dynamic phenomenon which carries over a specific time duration and localizing the extent of the activity at a single, chosen instant of time simultaneously. The present disclosure records an image stack consisting of N speckle images sequentially over a period, divides the image stack into a spatial window and a temporal window, converts the speckle intensity data comprised in the spatial window into a column vector. Construct a diagonal matrix and extract a singular value from the diagonal matrix, then defines a speckle intensity correlation metric using the plurality of singular values, defines a speckle activity and generates a speckle contrast image by graphically plotting the speckle activity values.


Find Patent Forward Citations

Loading…