The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Nov. 18, 2020
Applicant:

Volume Graphics Gmbh, Heidelberg, DE;

Inventor:

Christoph Poliwoda, Heidelberg, DE;

Assignee:

VOLUME GRAPHICS GMBH, Heidelberg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/136 (2017.01); G06T 7/187 (2017.01);
U.S. Cl.
CPC ...
G06T 7/136 (2017.01); G06T 7/187 (2017.01); G06T 2207/10081 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30108 (2013.01);
Abstract

The invention relates to a computer-implemented method for segmenting measurement data from a measurement of an object, the object having at least one Material transition region, the measurement data generating a digital representation of the object having the at least one at least one material transition region, the digital object representation having a plurality of pieces of spatially-resolved image information of the object, the method comprising the following steps: determining the measurement data; segmenting at least two homogenous regions of the digital object representation; and determining the position of at least one material transition region between the at least two homogeneous regions. The invention thus provides an improved computer-implemented method for segmenting measurement data from a measurement of an object, which correctly detects material transitions from the measurement data of the object.


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