The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Aug. 18, 2021
Screen Holdings Co., Ltd., Kyoto, JP;
Kyoto Prefectural Public University Corporation, Kyoto, JP;
Maki Hirai, Kyoto, JP;
Hiroshi Ogi, Kyoto, JP;
Shunta Ishihara, Kyoto, JP;
Takahiro Tsujikawa, Kyoto, JP;
Kyoko Itoh, Kyoto, JP;
SCREEN Holdings Co., Ltd., Kyoto, JP;
Kyoto Prefectural Public University Corporation, Kyoto, JP;
Abstract
An image processing using a plurality of specimen images obtained by successively applying a plurality of types of staining to a specimen to be evaluated and imaging the specimen after staining for at least two types of staining is performed. The image processing comprises: extracting an inner region corresponding to inward of a cell membrane of a single cell in the specimen based on at least one of the specimen images; specifying a cell region corresponding to an individual cell included in the specimen by expanding the inner region outwardly; and performing image cytometry for the cell region based on the specimen images. In analyzing a pathological specimen on a cell-by-cell basis, it is possible to deal with multiple immunostaining and specify the positions of individual cells and evaluate each cell separately even when a cell density in the specimen is high.