The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 11, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jeongwon Lee, Suwon-si, KR;

Eunho Kim, Suwon-si, KR;

Changgon Kim, Suwon-si, KR;

Jaecheol Bae, Suwon-si, KR;

Hongseok Yang, Suwon-si, KR;

Sanghwan Jeong, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/74 (2022.01); G06V 10/75 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/751 (2022.01); G06V 10/761 (2022.01); G06V 10/98 (2022.01); G06T 2207/10144 (2013.01);
Abstract

An electronic device is provided. The electronic device includes a memory, an image sensor including light receiving elements each including at least two sub light receiving elements, and an image signal processor. The image signal processor is configured to obtain images corresponding to light from outside by using the image sensor, the images including at least a raw image, a first sub image, and a second sub image, the first sub image being an image corresponding to light detected by at least one first sub light, the second sub image being an image corresponding to light detected by at least one second sub light, identify a luminance ratio between the first sub image and the second sub image, identify a defect in the raw image, based on the luminance ratio, and perform a function corresponding to a type of the defect.


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