The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

May. 16, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Daehyun Ban, Suwon-si, KR;

Yongsung Kim, Suwon-si, KR;

Dongwan Lee, Suwon-si, KR;

Juyoung Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/4046 (2024.01); G06T 3/4053 (2024.01); G06T 5/30 (2006.01); G06T 5/50 (2006.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G06T 3/4053 (2013.01); G06T 5/30 (2013.01); G06T 5/50 (2013.01); G06V 10/7715 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method of operating an image processing apparatus is provided. The method includes generating a first feature map by performing a convolution operation between a first image and a first kernel group, generating a second feature map by performing a convolution operation between the first image and a second kernel group, generating a first combination map based on the first feature map, generating a second combination map based on the first feature map and the second feature map, generating a second image based on the first combination map and the second combination map, and generating a reconstructed image of the first image, based on the second image and the first image, and generating a high-resolution image of the first image by inputting the reconstructed image to an upscaling model.


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