The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Oct. 16, 2020
Deere & Company, Moline, IL (US);
Zhiqiang Yuan, San Jose, CA (US);
Theodore Monyak, San Francisco, CA (US);
Deere & Company, Moline, IL (US);
Abstract
Techniques are disclosed that enable generating a predicted yield for a cereal grain crop based on one or more traits extracted from image(s) of the cereal grain crop. Various implementations include determining a heading trait value based on the number of identified spikelets, where the spikelets are identified by processing the image(s) of the cereal grain crop using a spikelet detection model. Additional or alternative implementations include generating a predicted cereal grain crop yield based on one or more additional or alternative trait values such as one or more heading values, one or more projected leaf area values, one or more stand spacing values, one or more wheat rust values, one or more maturity detection values, one or more intercropping phenotyping values extracted cereal grains intercropped with other crops, one or more additional or alternative trait output values, and/or combinations thereof.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile