The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Feb. 12, 2022
Applied Materials, Inc., Santa Clara, CA (US);
Luca Vandelli, Scandiano, IT;
Matteo Bertocchi, Mirandola, IT;
Stefano Dominici, Parma, IT;
Luca Larcher, Reggio Emilia, IT;
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
A simulation of an electronic device may use a distribution of atomistic defects to provide more accurate results. An input mesh may be received representing a physical structure of the electronic device. This input mesh may be transformed into a polyhedral mesh to facilitate the simulation. A distribution of defects may then be generated and distributed throughout the polyhedral mesh. When performing each time step of the simulation, the effects of these defects may be attributed to individual cells in the polyhedral mesh and incorporated into the simulation equations for each volume. For example, charge and power contributions from the defects may be incorporated into the simulation equations to more accurately model the performance of the device.