The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Feb. 21, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Shunsuke Sasaki, Tokyo, JP;

Taku Sakazume, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01); G06F 3/04847 (2022.01); G06F 3/0485 (2022.01);
U.S. Cl.
CPC ...
G06F 3/04847 (2013.01); G01N 35/00722 (2013.01); G01N 35/1002 (2013.01); G06F 3/0485 (2013.01); G01N 2035/0091 (2013.01); G06F 2203/04803 (2013.01);
Abstract

The automated analyzer comprises: an analysis operation unit for analyzing a reaction liquid, control unit for controlling the operation of the analysis operation unit, a storage unit for storing analysis results from the analysis operation unit and information about a consumable used by the analysis operation unit, and a display unit for displaying the analysis results and inspection information. The control unit generates an inspection information display GUI including a first inspection information display area for displaying first inspection information from among the inspection information and a second inspection information display area for displaying second inspection information, which is different from the first inspection information, from among the inspection information, controls the display unit such that when the inspection information display GUI is displayed on the screen of the display unit, the first inspection information and second inspection information are displayed in different display formats.


Find Patent Forward Citations

Sasaki, Shunsuke. (2025). Automated analyzer displaying a gui including first and second inspection information (U.S. Patent No. 12333131). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12333131

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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