The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Jan. 20, 2023
Nec Laboratories America, Inc., Princeton, NJ (US);
Yanchi Liu, Monmouth Junction, NJ (US);
Xuchao Zhang, Elkridge, MD (US);
Haifeng Chen, West Windsor, NJ (US);
Wei Cheng, Princeton Junction, NJ (US);
Shengming Zhang, Kearny, NJ (US);
NEC Corporation, Tokyo, JP;
Abstract
A method for implementing a self-attentive encoder-decoder transformer framework for anomaly detection in event sequences is presented. The method includes feeding event content information into a content-awareness layer to generate event representations, inputting, into an encoder, event sequences of two hierarchies to capture long-term and short-term patterns and to generate feature maps, adding, in the decoder, a special sequence token at a beginning of an input sequence under detection, during a training stage, applying a one-class objective to bound the decoded special sequence token with a reconstruction loss for sequence forecasting using the generated feature maps from the encoder, and during a testing stage, labeling any event representation whose decoded special sequence token lies outside a hypersphere as an anomaly.