The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 29, 2023
Applicant:

Kabushiki Kaisha Yaskawa Denki, Kitakyushu, JP;

Inventors:

Ryohei Suzuki, Tokyo, JP;

Ryo Kabutan, Fukuoka, JP;

Takuya Kadoya, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 18/2148 (2023.01); G06N 20/00 (2019.01); G06F 18/214 (2023.01);
Abstract

Provided is a generation system including: one or more processors which acquire waveform data; specify an intention of a user; and generate pseudo waveform data from the waveform data acquired in such a manner that an intention of a user specified is reflected. Provided is a method for generating a waveform evaluation model executed by a computer, including: acquiring waveform data; specifying an intention of a user; generating pseudo waveform by generating pseudo waveform data from the waveform data acquired in the acquiring the waveform data in such a manner that the intention of the user specified in the specifying the intention is reflected; and executing learning by executing machine learning using the pseudo waveform data generated in the generating the pseudo waveform to generate a waveform evaluation model which outputs an evaluation result of input waveform data.


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