The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Feb. 10, 2023
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jae Hyeon Bae, San Jose, CA (US);

Kurt M. Fredericks, San Francisco, CA (US);

Nicholas Kistner, Cupertino, CA (US);

Andrew T. Maher, London, GB;

Nihar Ranjan Hati, Santa Clara, CA (US);

Mahesh Molakalapalli, Santa Clara, CA (US);

Srivas Chennu, Rochester, GB;

Jamie J. Martin, London, GB;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/3604 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01);
Abstract

This application sets forth techniques for variant testing at scale. In particular, the embodiments set forth provide systems and methods for testing, on a large-scale software application store, visual aspects of one or more variants of representative data associated with an application available through the software application store. According to some embodiments, a method may include using a subset of conversion data associated with a control object and a subset of the conversion data associated with at least one variant object to compute at least one conversion metric for the control object and at least one conversion metric for the at least one variant object. The method may also include generating a performance measurement by applying at least one statistical hypothesis testing function to the at least one conversion metric for the control object and the at least one conversion metric for the at least one variant object.


Find Patent Forward Citations

Bae, Jae. (2025). Systems and methods for variant testing at scale (U.S. Patent No. 12332765). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12332765

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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