The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Feb. 20, 2024
International Business Machines Corporation, Armonk, NY (US);
Seep Goel, Bengaluru, IN;
Kavya Govindarajan, Chennai, IN;
Chander Govindarajan, Chennai, IN;
Priyanka Prakash Naik, Mumbai, IN;
Praveen Jayachandran, Bangalore, IN;
Aishwariya Chakraborty, Bankura, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Metric management techniques in a multi-cluster computing environment are disclosed. For example, a method obtains a set of metrics collected from one or more computing clusters of a distributed computing environment, wherein the set of metrics are associated with one or more processes that are executable on the one or more computing clusters. The method computes one or more metric importance values for the set of metrics based on one or more processing criteria. The method sends the one or more metric importance values to at least one computing cluster of the one or more computing clusters to enable the at least one computing cluster to adapt a collection frequency of at least one metric of the set of metrics. Such adaptation, by way of example, can be based on the metric importance and resource availability.