The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 13, 2021
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Bin Gao, Beijing, CN;

Peng Yao, Beijing, CN;

Huaqiang Wu, Beijing, CN;

Jianshi Tang, Beijing, CN;

He Qian, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/073 (2013.01);
Abstract

A storage and computation integrated apparatus and a calibration method therefor. The storage and computation integrated apparatus includes a first processing unit, which includes: a first computation memristor array; a first calibration memristor array; and a first processing unit. The calibration method includes: determining, by means of off-chip training, a first computation weight matrix which corresponds to a first computation memristor array, and writing the first computation weight matrix into the first computation memristor array; and on the basis of the first computation memristor array where the first computation weight matrix has been written and the first computation weight matrix, performing on-chip training on a first calibration memristor array, so as to adjust a weight value of the first calibration memristor array.


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