The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Nov. 02, 2020
Jfe Steel Corporation, Tokyo, JP;
Tomohiko Ito, Tokyo, JP;
Kazuhira Ichikawa, Tokyo, JP;
Tetsuya Yamamoto, Tokyo, JP;
Shingo Sugioka, Tokyo, JP;
Hiroyuki Shimamoto, Tokyo, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
A production facilities monitoring method monitors an operation status of a plurality of production facilities of a same kind located at a plurality of production sites and includes: a data information preparation step of aggregating operational data of each of the production facilities for each of the production sites; a data accumulation step of accumulating the operational data aggregated at the data information preparation step into a computer located at a data accumulation site; a data analysis step of analyzing a current operation status at each of the production facilities, using current operational data and past operational data accumulated at the data accumulation step; and an operation status determination step of determining whether operation is abnormal at each of the production facilities, based on an analysis result of the data analysis step.