The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Mar. 22, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yuki Nakamura, Kanagawa, JP;

Masaaki Suzuki, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13363 (2006.01); C09K 19/02 (2006.01); C09K 19/04 (2006.01); G02F 1/1333 (2006.01); G02F 1/1335 (2006.01); G02F 1/137 (2006.01); H10K 59/80 (2023.01);
U.S. Cl.
CPC ...
G02F 1/133633 (2021.01); C09K 19/02 (2013.01); C09K 19/04 (2013.01); G02F 1/133365 (2013.01); G02F 1/133528 (2013.01); G02F 1/137 (2013.01); C09K 2019/0448 (2013.01); H10K 59/8791 (2023.02);
Abstract

An optically anisotropic layer in which the occurrence of a haze is suppressed and a winding aptitude is excellent; and an optical film, a polarizing plate, and an image display device, each having the optically anisotropic layer. The optically anisotropic layer is obtained by polymerizing a polymerizable liquid crystal composition containing a polymerizable liquid crystal compound, in which in a case where an amplitude value at each wavelength determined by subjecting data of a three-dimensional surface roughness to a Fourier transform is defined as L, the amplitude value L at a wavelength of 5 μm or more is 0.125 or more, and the amplitude value L at a wavelength of 2.0 to 2.5 μm is 0.025 or less.


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