The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Mar. 18, 2020
Applicant:
The Regents of the University of Michigan, Ann Arbor, MI (US);
Inventors:
Haijun Li, Ann Arbor, MI (US);
Thomas D. Wang, Ann Arbor, MI (US);
Assignee:
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/10 (2006.01); A61B 1/00 (2006.01); B81B 3/00 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); A61B 1/00172 (2013.01); B81B 3/0043 (2013.01); G02B 26/0841 (2013.01); B81B 2201/042 (2013.01); B81B 2203/0136 (2013.01); B81B 2203/0163 (2013.01); B81B 2203/04 (2013.01); B81B 2203/053 (2013.01); B81B 2203/058 (2013.01);
Abstract
A scanning assembly for an optical instrument includes a reflector and a folded-beam spring assembly coupled to the reflector for deflecting the reflector for beam scanning. A lever suspension assembly is coupled to the folded-beam spring assembly and provides torsional movement of the reflector for beam scanning over a two-dimensional region, allowing for large total scan angles and large vertical displacements.