The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 22, 2020
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventor:

Christian Schumann, Lich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/367 (2013.01);
Abstract

An optical system for a light-sheet microscope comprises transporting optics configured to project, into a sample, a light sheet for illuminating a sample plane positioned obliquely to an optical axis of the transporting optics and to project the illuminated sample plane into an intermediate image space. The transporting optics comprises an interchanging system that includes a first light-deflection element and a second light-deflection element. The interchanging system is configured to switch an illumination direction along which the light sheet illuminates the sample by alternately introducing the first light-deflection element and the second light-deflection element into a beam path of the transporting optics. The first light-deflection element causes a partial image inversion in only one direction. The second light-deflection element causes a complete image inversion in two directions.


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