The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Sep. 21, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Thomas Ruster, Munich, DE;

Miguel Bueno Diez, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 1/24 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G01R 1/24 (2013.01);
Abstract

Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting preferably coherent light onto the reflective planar face, and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.


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