The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 16, 2020
Applicants:

Thyssenkrupp Rothe Erde Germany Gmbh, Dortmund, DE;

Thyssenkrupp Ag, Essen, DE;

Inventors:

Gunther Elfert, Erwitte, DE;

Bernd Stakemeier, Erwitte, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/44 (2006.01); F16C 41/00 (2006.01); G01D 5/20 (2006.01); G01D 11/02 (2006.01); F16C 19/38 (2006.01);
U.S. Cl.
CPC ...
G01P 3/443 (2013.01); F16C 41/007 (2013.01); G01D 5/202 (2013.01); G01D 11/02 (2013.01); F16C 19/381 (2013.01); F16C 2233/00 (2013.01);
Abstract

A rolling bearing may have at least two bearing rings arranged rotatably relative to each other, at least one row of rolling elements arranged such that they can roll between the bearing rings, and a position-determining device for determining an absolute angular position of the bearing rings relative to each other. The position-determining device includes field patterns that are arranged on a surface of a first of the bearing rings and distributed around a circumference thereof, with fields of the field patterns having field heights with discrete values. The position-determining device also includes at least one eddy current sensor that is provided on a second of the bearing rings to scan the field patterns. An evaluation device may be configured to assign an associated angular position signal, which describes the absolute angular position of the first and second bearing rings relative to each other, to a scan of each field pattern.


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