The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 18, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yuichi Iwase, Tokyo, JP;

Kohei Nonaka, Tokyo, JP;

Tetsuji Kawahara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 35/1004 (2013.01); G01N 35/1009 (2013.01);
Abstract

The fluid temperature within piping of a sample dispensing system is stabilized in order to maintain stable dispensing performance with high precision in an automatic analyzer. A controller executes a first operation sequence to operate the sample dispensing system in a standby state continued until the sample is transported to the sample dispensing position, and executes a second operation sequence to operate the sample dispensing system in an analysis state in which the sample located in the sample dispensing position is dispensed. A time period during interior cleaning performed on the sample probe in a single cycle of the first operation sequence is set to be shorter than a time period during interior cleaning performed on the sample probe in a single cycle of the second operation sequence. Alternatively, the first operation sequence is configured to perform interior cleaning at a rate of once every multiple of cycles.


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