The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Feb. 25, 2021
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Kyoto University, Kyoto, JP;

Inventors:

Hidefumi Takamine, Shinagawa, JP;

Yuki Ueda, Yokohama, JP;

Kazuo Watabe, Yokohama, JP;

Tomoki Shiotani, Kyoto, JP;

Katsufumi Hashimoto, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/14 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/14 (2013.01); G01N 29/2437 (2013.01); G01N 29/44 (2013.01);
Abstract

According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, a position locator, and an evaluator. The plurality of sensors detect elastic waves. The position locator locates elastic wave sources on the basis of a plurality of elastic waves detected by each of the plurality of sensors. The evaluator evaluates a deterioration state of a structure in accordance with a presence or absence of a sensor and an elastic wave source distribution which shows a position of the elastic wave sources obtained on the basis of a result of locating of the elastic wave sources.


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