The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Nov. 16, 2022
Applicant:

Conocophillips Company, Houston, TX (US);

Inventors:

Hesham F. El-Sobky, Houston, TX (US);

Ronald J. M. Bonnie, Houston, TX (US);

Tianmin Jiang, Houston, TX (US);

Assignee:

ConocoPhillips Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/08 (2006.01); G01V 3/32 (2006.01);
U.S. Cl.
CPC ...
G01N 24/081 (2013.01); G01V 3/32 (2013.01);
Abstract

Implementations described and claimed herein provide systems and methods for determining surfactant impact on reservoir wettability. In one implementation, a nuclear magnetic resonance Tmeasurement of a sample is obtained before surfactant imbibition is applied to the sample, and a second nuclear magnetic Tmeasurement of the sample is made after forced imbibition of the surfactant. Moreover, another nuclear magnetic resonance Tmeasurement (e.g., omitting surfactant imbibition) can be obtained simultaneously with the nuclear magnetic resonance Tmeasurement using a twin core sample. The nuclear magnetic resonance Tmeasurement and the nuclear magnetic resonance Tmeasurement are captured under simulated reservoir conditions. A fluid typing map is generated using the nuclear magnetic resonance Tmeasurement and the nuclear magnetic resonance Tmeasurement. An impact of the surfactant on fluid producibility is determined based on the fluid typing map.


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