The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Apr. 20, 2023
Arion Diagnostics, Inc., Petaluma, CA (US);
Alexander P. Lazarev, Lake Forest, CA (US);
Pavel I. Lazarev, Menlo Park, CA (US);
Delvin Tai Wai Yuk, Atherton, CA (US);
Arion Diagnostics, Inc., Petaluma, CA (US);
Abstract
An X-ray diffractometer system analyzes objects including biological tissue samples and physical and chemical samples. The diffractometer system includes an X-ray beam projector that projects an incident micro-beam of X-ray at an analysis target, an X-ray receiver including an X-ray detector array to detect the transmitted X-rays passed through the object and X-rays that the target diffracts, and a computer workstation for system control and data analysis. The X-ray beam projector may include a radiation source, a beam forming system including at least one of a monochromator, a collimator, and focusing device. The computer workstation may control the X-ray devices and positioning mechanisms and motors, may acquire, process, store, or display data received from diffractometric examination, and may also calculate parameters of the three-dimensional reciprocal lattice of the analyzed target.