The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Jun. 24, 2021
Applicants:
Joseph Bendahan, San Jose, CA (US);
Smiths Detection Inc., Edgewood, MD (US);
Inventor:
Joseph Bendahan, San Jose, CA (US);
Assignee:
Smiths Detection Inc., Edgewood, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2006.01); G01N 23/20008 (2018.01); G01V 5/222 (2024.01);
U.S. Cl.
CPC ...
G01N 23/203 (2013.01); G01N 23/20008 (2013.01); G01N 2223/053 (2013.01); G01V 5/222 (2024.01);
Abstract
Described herein are systems and methods for backscatter imaging. A backscatter imaging system configurable in real-time for imaging an object is provided. The backscatter imaging system includes a source array including a plurality of discrete sources, and a collimator array including a plurality of collimators corresponding to the plurality of discrete sources. The source array is configured to selectively activate the plurality of discrete sources at a frequency that is determined based at least in part on a speed of the object relative to the backscatter imaging system.