The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 22, 2022
Applicant:

Horiba Stec, Co., Ltd., Kyoto, JP;

Inventors:

Yoshiaki Nakata, Kyoto, JP;

Masakazu Minami, Kyoto, JP;

Yuhei Sakaguchi, Kyoto, JP;

Toru Shimizu, Kyoto, JP;

Takeshi Akamatsu, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/61 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/61 (2013.01); G01N 33/0027 (2013.01); G01N 33/007 (2013.01);
Abstract

In order to prevent cracking of a window material in manufacturing an optical measurement cell that satisfies various performances required for airtightness, heat resistance, and the like by atomic diffusion bonding, an optical measurement cell into which a sample is introduced includes a light transmission window through which light is transmitted, and includes a window material forming the light transmission window, and a flange member to which the window material is bonded via a metal thin film, and a ratio of a thermal expansion coefficient of the flange member to a thermal expansion coefficient of the window material is 0.5 times or more and 1.5 times or less.


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