The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Sep. 30, 2021
Applicant:

J.a. Woollam Co., Inc., Lincoln, NE (US);

Inventors:

Ping He, Lincoln, NE (US);

Martin M. Liphardt, Lincoln, NE (US);

Galen L. Pfeiffer, Roca, NE (US);

Assignee:

J.A. WOOLLAM CO., INC., Lincoln, NE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/211 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/127 (2013.01);
Abstract

Systems for and methodology of calibration, as well as testing of beam directing Ellipsometer systems which utilize polarized electromagnetic radiation to investigate samples.


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He, Ping. (2025). System for, and calibration and testing of directed beam ellipsometer systems (U.S. Patent No. 12332163). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12332163

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