The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 09, 2021
Applicant:

Raytheon Company, Arlington, VA (US);

Inventor:

Adam C. Wood, Oro Valley, AZ (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 11/125 (2021.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G01K 11/125 (2013.01); G02B 26/0816 (2013.01);
Abstract

A thermal testing system includes a mirror array, having tiltable mirror elements, that reflects thermal radiation output from a radiative heat source. The mirror elements can be tilted as required to achieve a desired radiative heating profile, for example on an object to be tested. The thermal testing system may also have additional mirror arrays, and/or a heat sink. The radiative heat source may be stationary, and may have different zones (for example with different bulbs) that may be controlled separately, for example by having separate illumination intensity control for the different zones. The testing system may be configured for different tests, and/or to provide time-varying heating profiles.


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