The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Jun. 23, 2021
Applicants:

Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;

Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;

Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;

Inventors:

Lei Xu, Changzhou, CN;

Jean Christophe Emery, Shanghai, CN;

Li Yang, Changzhou, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01G 23/01 (2006.01);
U.S. Cl.
CPC ...
G01G 23/012 (2013.01);
Abstract

A method for configuring a calibration mechanism in a force sensor () has the steps of: coupling an end of the calibration lever () to a loading end () of the force sensor; adjusting, in a no-load condition, the center of gravity (G) of the unloaded calibration lever (), so that the center of gravity (G) lies on a horizontal line (H) through the center of a calibration lever fulcrum () at a fixed end () thereof; and adjusting, in a full-load condition, the center of gravity (G) of the calibration lever () loaded with the calibration weight (), so that the center of gravity (G) lies on the horizontal line (H) through the center of the calibration lever fulcrum. The calibration error caused by inclination in the force sensor is reduced by practice of this method.


Find Patent Forward Citations

Loading…