The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Sep. 14, 2021
Yeda Research and Development Co. Ltd., Rehovot, IL;
Ilan Koren, Rehovot, IL;
Assaf Vardi, Rehovot, IL;
Yinon Rudich, Rehovot, IL;
Adi Volpert, Rehovot, IL;
Joseph Bolless, Rehovot, IL;
Yeda Research and Development Co. Ltd., Rehovot, IL;
Abstract
A method for monitoring species of algae for stress comprises growing a test set of algae of a given species, applying a stress of a predetermined kind to some of the algae, and irradiating the algae at a predetermined first set of wavelengths. The algae are then monitored at a predetermined second set of wavelengths to detect fluorescence and/or absorbance carried out on the first set of wavelengths by the stressed algae. The detected fluorescence and/or absorbance is compared for each irradiation wavelength between the stressed algae and unstressed algae to find signs indicating the applied stress. There is then a stage of searching through combinations of respective irradiation wavelengths and detected wavelengths to find a minimal set of irradiating and detected wavelengths that detects the stress. The smallest size set is then used in irradiating further sets of algae of the tested species to detect the given stress.